1

INVENTORY #116503

Data-Driven Techniques For Fault Detection and Diagnosis in Chemical Processes

RUSSELL, Evan L.; CHIANG, Leo H.; BRAATZ, Richard D.

Regular price $50.00 Sale

Publication Info

  • Publisher: Springer
  • Edition: n/a
  • Date Published: 2000
  • Place Published: London
  • ISBN: 1852332581

Details

  • Condition: Fine
  • Signed: No
  • Dust Jacket: No
  • Jacket Condition: n/a
  • Details:
    Advances in Industrial Control series. xiii, 192 p. 24 cm. 49 figures and tables. Hardcover.

Share the book love

Have a Question about this item?